Hamdioui, Said: search on Z-Library

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1

[IEEE 2019 IEEE 28th Asian Test Symposium (ATS) - Kolkata, India (2019.12.10-2019.12.13)] 2019 IEEE 28th Asian Test Symposium (ATS) - Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

Augusto da Silva, Felipe, Bagbaba, Ahmet Cagri, Hamdioui, Said, Sauer, Christian

Year:

2019

File:

PDF, 4.92 MB

2019

2

[IEEE 2020 IEEE 38th VLSI Test Symposium (VTS) - San Diego, CA, USA (2020.4.5-2020.4.8)] 2020 IEEE 38th VLSI Test Symposium (VTS) - Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks

da Silva, Felipe Augusto, Cagri Bagbaba, Ahmet, Ruospo, Annachiara, Mariani, Riccardo, Kanawati, Ghani, Sanchez, Ernesto, Reorda, Matteo Sonza, Jenihhin, Maksim, Hamdioui, Said, Sauer, Christian

Year:

2020

File:

PDF, 315 KB

2020

3

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - G-PUF: An Intrinsic PUF Based on GPU Error Signatures

Forlin, Bruno, Husemann, Ronaldo, Carro, Luigi, Reinbrecht, Cezar, Hamdioui, Said, Taouil, Mottaqiallah

Year:

2020

File:

PDF, 187 KB

2020

4

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs

da Silva, Felipe Augusto, Bagbaba, Ahmet Cagri, Sartoni, Sandro, Cantoro, Riccardo, Reorda, Matteo Sonza, Hamdioui, Said, Sauer, Christian

Year:

2020

File:

PDF, 290 KB

2020

5

Introduction to spin wave computing

Mahmoud, Abdulqader, Ciubotaru, Florin, Vanderveken, Frederic, Chumak, Andrii V., Hamdioui, Said, Adelmann, Christoph, Cotofana, Sorin

Journal:

Journal of Applied Physics

Year:

2020

File:

PDF, 9.61 MB

2020

6

[IEEE 2010 IEEE 10th Conference on Nanotechnology (IEEE-NANO) - Ilsan, Gyeonggi-Do, Korea (South) (2010.08.17-2010.08.20)] 10th IEEE International Conference on Nanotechnology - Mitigating defective CMOS to Non-CMOS vias in CMOS/Molecular memories

Haron, Nor Zaidi, Hamdioui, Said

Year:

2010

Language:

english

File:

PDF, 659 KB

english, 2010

7

[IEEE 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Palma de Mallorca, Spain (2017.4.4-2017.4.6)] 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Interconnect networks for resistive computing architectures

Nguyen, H.A. Du, Xie, Lei, Yu, Jintao, Taouil, Mottaqiallah, Hamdioui, Said

Year:

2017

Language:

english

File:

PDF, 2.07 MB

english, 2017

8

[IEEE 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Sapporo, Japan (2019.5.26-2019.5.29)] 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Memristive Device Modeling and Circuit Design Exploration for Computation-in-Memory

Siemon, Anne, Wouters, Dirk, Hamdioui, Said, Menzel, Stephan

Year:

2019

File:

PDF, 1.35 MB

2019

9

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

Marinissen, Erik Jan, De Wachter, Bart, Smith, Ken, Kiesewetter, Jorg, Taouil, Mottaqiallah, Hamdioui, Said

Year:

2014

Language:

english

File:

PDF, 2.01 MB

english, 2014

10

Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

Agbo, Innocent, Taouil, Mottaqiallah, Kraak, Daniël, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Raghavan, Praveen, Catthoor, Francky, Dehaene, Wim

Journal:

Microelectronics Reliability

Year:

2019

Language:

english

File:

PDF, 2.32 MB

english, 2019

11

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - RNN-Based Detection of Fault Attacks on RSA

Koylu, Troya Cagail, Reinbrecht, Cezar Rodolfo Wedig, Hamdioui, Said, Taouil, Mottaqiallah

Year:

2020

File:

PDF, 298 KB

2020

12

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Hacking and protecting IC hardware

Hamdioui, Said, Danger, Jean-Luc, Natale, Giorgio Di, Smailbegovic, Fethulah, Battum, Gerard van, Tehranipoor, Mark

Year:

2014

Language:

english

File:

PDF, 773 KB

english, 2014

13

Impact and mitigation of SRAM read path aging

Agbo, Innocent, Taouil, Mottaqiallah, Kraak, Daniël, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky, Dehaene, Wim

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 1.16 MB

english, 2018

14

[IEEE 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Sapporo, Japan (2019.5.26-2019.5.29)] 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Memristive Device Based Circuits for Computation-in-Memory Architectures

Lebdeh, Muath Abu, Reinsalud, Uljana, Nguyen, Hoang Anh Du, Wong, Stephan, Hamdioui, Said

Year:

2019

File:

PDF, 333 KB

2019

15

[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Design dependent SRAM PUF robustness analysis

Cortez, Mafalda, Hamdioui, Said, Ishihara, Ryoichi

Year:

2015

File:

PDF, 434 KB

2015

16

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Modeling Static Noise Margin for FinFET based SRAM PUFs

Masoumian, Shayesteh, Selimis, Georgios, Maes, Roel, Schrijen, Geert-Jan, Hamdioui, Said, Taouil, Mottaqiallah

Year:

2020

File:

PDF, 355 KB

2020

17

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Kukner, Halil, Khan, Seyab, Weckx, Pieter, Raghavan, Praveen, Hamdioui, Said, Kaczer, Ben, Catthoor, Francky, Van der Perre, Liesbet, Lauwereins, Rudy, Groeseneken, Guido

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.02 MB

english, 2014

18

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Detecting memory faults in the presence of bit line coupling in SRAM devices

Irobi, Sandra, Al-Ars, Zaid, Hamdioui, Said

Year:

2010

Language:

english

File:

PDF, 157 KB

english, 2010

19

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - ECC design for fault-tolerant crossbar memories: A case study

Haron, Nor Zaidi, Hamdioui, Said, Ahyadi, Zaiyan

Year:

2010

Language:

english

File:

PDF, 1.08 MB

english, 2010

20

System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation

Majzoub, Sohaib, Taouil, Mottaqiallah, Hamdioui, Said

Journal:

Journal of Low Power Electronics

Year:

2019

Language:

english

File:

PDF, 1.80 MB

english, 2019

21

[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Methodology for Application-Dependent Degradation Analysis of Memory Timing

Kraak, Daniel, Agbo, Innocent, Taouil, Mottaqiallah, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky

Year:

2019

Language:

english

File:

PDF, 134 KB

english, 2019

22

[IEEE 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Sapporo, Japan (2019.5.26-2019.5.29)] 2019 IEEE International Symposium on Circuits and Systems (ISCAS) - Memristive Device Based Circuits for Computation-in-Memory Architectures

Lebdeh, Muath Abu, Reinsalud, Uljana, Nguyen, Hoang Anh Du, Wong, Stephan, Hamdioui, Said

Year:

2019

Language:

english

File:

PDF, 333 KB

english, 2019

23

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers

Papameletis, Christos, Keller, Brion, Chickermane, Vivek, Marinissen, Erik Jan, Hamdioui, Said

Year:

2013

Language:

english

File:

PDF, 623 KB

english, 2013

24

Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

Agbo, Innocent, Taouil, Mottaqiallah, Kraak, Daniël, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Raghavan, Praveen, Catthoor, Francky, Dehaene, Wim

Journal:

Microelectronics Reliability

Year:

2019

File:

PDF, 2.32 MB

2019

25

Testing Open Defects in Memristor-Based Memories

Hamdioui, Said, Taouil, Mottaqiallah, Haron, Nor Zaidi

Journal:

IEEE Transactions on Computers

Year:

2015

Language:

english

File:

PDF, 1.10 MB

english, 2015

26

[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Degradation analysis of high performance 14nm FinFET SRAM

Kraak, Daniel, Agbo, Innocent, Taouil, Mottaqiallah, Hamdioui, Said, Weckx, Pieter, Cosemans, Stefan, Catthoor, Francky

Year:

2018

Language:

english

File:

PDF, 253 KB

english, 2018

27

Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy

Said Hamdioui, Ad J. Van De Goor

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 131 KB

english, 2000

28

[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Low-cost, customized and flexible SRAM MBIST engine

van de Goor, Ad, Jung, Christian, Hamdioui, Said, Gaydadjiev, Georgi

Year:

2010

Language:

english

File:

PDF, 343 KB

english, 2010

29

[IEEE 2009 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems - Shenzhen, China (2009.01.5-2009.01.8)] 2009 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems - Emerging non-CMOS nanoelectronic devices - What are they?

Nor Zaidi Haron,, Hamdioui, Said, Cotofana, Sorin

Year:

2009

Language:

english

File:

PDF, 2.46 MB

english, 2009

30

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - DRAM-Specific Space of Memory Tests

Al-Ars, Zaid, Hamdioui, Said, De Goor, Ad, Gaydadjiev, Georgi, Vollrath, Joerg

Year:

2006

Language:

english

File:

PDF, 250 KB

english, 2006

31

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Stacking order impact on overall 3D die-to-wafer Stacked-IC cost

Taouil, Mottaqiallah, Hamdioui, Said

Year:

2011

Language:

english

File:

PDF, 777 KB

english, 2011

32

Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching

Taouil, Mottaqiallah, Hamdioui, Said, Marinissen, Erik Jan

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2015

Language:

english

File:

PDF, 1.06 MB

english, 2015

33

[IEEE 2016 17th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2016.3.15-2016.3.16)] 2016 17th International Symposium on Quality Electronic Design (ISQED) - Instruction cache aging mitigation through Instruction Set Encoding

Gebregiorgis, Anteneh, Oboril, Fabian, Tahoori, Mehdi B., Hamdioui, Said

Year:

2016

Language:

english

File:

PDF, 787 KB

english, 2016

34

[IEEE 2020 IEEE 38th VLSI Test Symposium (VTS) - San Diego, CA, USA (2020.4.5-2020.4.8)] 2020 IEEE 38th VLSI Test Symposium (VTS) - Special Session â Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis

Bishnoi, Rajendra, Wu, Lizhou, Fieback, Moritz, Munch, Christopher, Nair, Sarath Mohanachandran, Tahoori, Mehdi, Wang, Ying, Li, Huawei, Hamdioui, Said

Year:

2020

File:

PDF, 1.18 MB

2020

35

[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories

Haron, Nor Zaidi, Hamdioui, Said

Year:

2009

Language:

english

File:

PDF, 272 KB

english, 2009

36

[IEEE 2015 10th International Design & Test Symposium (IDT) - Dead Sea, Amman, Jordan (2015.12.14-2015.12.16)] 2015 10th International Design & Test Symposium (IDT) - Keynote 2: "Computing for big-data: Beyond CMOS and beyond Von-Neumann"

Year:

2015

Language:

english

File:

PDF, 127 KB

english, 2015

37

[IEEE 2018 IEEE 19th Latin-American Test Symposium (LATS) - Sao Paulo, Brazil (2018.3.12-2018.3.14)] 2018 IEEE 19th Latin-American Test Symposium (LATS) - Ionizing radiation modeling in DRAM transistors

Fieback, Moritz, Taouil, Mottaqiallah, Hamdioui, Said, Rovatti, Marco

Year:

2018

Language:

english

File:

PDF, 284 KB

english, 2018

38

Enhancing PUF Based Challenge–Response Sets by Exploiting Various Background Noise Configurations

Martin, Honorio, Peris-Lopez, Pedro, Natale, Giorgio, Taouil, Mottaqiallah, Hamdioui, Said

Journal:

Year:

2019

Language:

english

File:

PDF, 866 KB

english, 2019

39

[IEEE 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Limassol, Cyprus (2020.7.6-2020.7.8)] 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs

Reinbrecht, Cezar, Aljuffri, Abdullah, Hamdioui, Said, Taouil, Mottaqiallah, Forlin, Bruno, Sepulveda, Johanna

Year:

2020

File:

PDF, 862 KB

2020

40

Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost

Mottaqiallah Taouil, Said Hamdioui, Kees Beenakker, Erik Jan Marinissen

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 699 KB

english, 2012

41

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Why is CMOS scaling coming to an END?

Haron, Nor Zaidi, Hamdioui, Said

Year:

2008

Language:

english

File:

PDF, 1.66 MB

english, 2008

42

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Testing PUF-based secure key storage circuits

Cortez, Mafalda, Roelofs, Gijs, Hamdioui, Said, Natale, Giorgio di

Year:

2014

Language:

english

File:

PDF, 385 KB

english, 2014

43

[IEEE 2009 4th International Design and Test Workshop (IDT) - Riyadh, Saudi Arabia (2009.11.15-2009.11.17)] 2009 4th International Design and Test Workshop (IDT) - Non-algorithmic stress optimization using simulation for DRAMs

Al-Ars, Zaid, Hamdioui, Said

Year:

2009

Language:

english

File:

PDF, 504 KB

english, 2009

44

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

Agbo, Innocent, Taouil, Mottaqiallah, Hamdioui, Said, Cosemans, Stefan, Weckx, Pieter, Raghavan, Praveen, Catthoor, Francky

Year:

2015

Language:

english

File:

PDF, 576 KB

english, 2015

45

[IEEE Technology of Integrated Systems in Nanoscal Era (DTIS) - Cairo, Egypt (2009.04.6-2009.04.9)] 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era - Microelectronics R&D in North Africa and Middle East: Dream or reality?

Year:

2009

File:

PDF, 220 KB

2009

46

Defect and Fault Modeling Framework for STT-MRAM Testing

Wu, Lizhou, Rao, Siddharth, Taouil, Mottaqiallah, Cardoso Medeiros, Guilherme, Fieback, Moritz, Marinissen, Erik Jan, Kar, Gouri Sankar, Hamdioui, Said

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2019

Language:

english

File:

PDF, 8.29 MB

english, 2019

47

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - LiD-CAT: A Lightweight Detector for Cache ATtacks

Reinbrecht, Cezar, Hamdioui, Said, Taouil, Mottaqiallah, Niazmand, Behrad, Ghasempouri, Tara, Raik, Jaan, Sepulveda, Johanna

Year:

2020

File:

PDF, 470 KB

2020

48

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs

Taouil, Mottaqiallah, Hamdioui, Said, Verbree, Jouke, Marinissen, Erik Jan

Year:

2010

Language:

english

File:

PDF, 465 KB

english, 2010

49

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Evaluation of SRAM faulty behavior under bit line coupling

Al-Ars, Zaid, Hamdioui, Said

Year:

2008

Language:

english

File:

PDF, 145 KB

english, 2008

50

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Test Cost Analysis for 3D Die-to-Wafer Stacking

Taouil, Mottaqiallah, Hamdioui, Said, Beenakker, Kees, Marinissen, Erik Jan

Year:

2010

Language:

english

File:

PDF, 630 KB

english, 2010

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